Three-dimensional atomic scale analysis of nanostructured materials-Reference-Cited by-同舟云学术

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Three-dimensional atomic scale analysis of nanostructured materials

Published:2001-01 Issue:8 Volume:32 Page:731-739
ISSN:0968-4328
Container-title:Micron
language:en
Short-container-title:Micron

Author:

Cerezo A,Abraham M,Clifton P,Lane H,Larson D.J,Petford-Long A.K,Thuvander M,Warren P.J,Smith G.D.W

Publisher

Elsevier BV

Subject

Cell Biology,Structural Biology,General Physics and Astronomy,General Materials Science

Reference35 articles.

1. Characterization of sputter-deposited multilayers of Ni and Zr with APFIM/TAP

2. Anthony, T.C., 1988. Private communication.

3. The tomographic atom probe: A quantitative three‐dimensional nanoanalytical instrument on an atomic scale

4. An in-situ tem study of the thermal stability of nanocrystalline NiP

5. Magnetic Recording Head Materials

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