Comparative isotopic measurements on xenon and krypton-Reference-Cited by-同舟云学术

Comparative isotopic measurements on xenon and krypton

Published:1996-03 Issue:1 Volume:153 Page:L1-L5
ISSN:0168-1176
Container-title:International Journal of Mass Spectrometry and Ion Processes
language:en
Short-container-title:International Journal of Mass Spectrometry and Ion Processes

Author:

Aregbe Y,Valkiers S,Mayer K,De Bièvre P

Publisher

Elsevier BV

Subject

Spectroscopy

Reference6 articles.

1. Massenspektrometrie;Kienitz,1968

2. P. De Bièvre, S. Valkiers, F. Schaefer, H. Steffen Peiser and P. Seyfried, High-Accuracy Isotope Abundance Measurements for Metrology, PTB-Mitteilungen 104 4/94.

3. A three-ratio scheme for the measurement of isotopic ratios of silicon;Ku;J. Res. Nad. Inst. Stand. Technol.,1993

4. Kinetic Theory of Gases;Present,1958

5. R. Gonfiantini, S. Valkiers and P. De Bièvre, in preparation.

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