Electron beam potential depression as an ion trap in Fourier transform ion cyclotron resonance mass spectrometry
Author:
Publisher
Elsevier BV
Subject
Spectroscopy
Reference28 articles.
1. Analytical applications of FTICRMS;Dunbar,1991
2. Fourier transform ion cyclotron resonance mass spectrometry: the teenage years
3. Fourier transform mass spectrometry
4. Space Charge Neutralization in the Ionizing Beam of a Mass Spectrometer
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