Single and multiple ionization of Ar and Kr by low energy electron impact using a crossed beam apparatus-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Single and multiple ionization of Ar and Kr by low energy electron impact using a crossed beam apparatus

Published:1984-05 Issue:2 Volume:57 Page:167-178
ISSN:0168-1176
Container-title:International Journal of Mass Spectrometry and Ion Processes
language:en
Short-container-title:International Journal of Mass Spectrometry and Ion Processes

Author:

Mathur D.,Badrinathan C.

Publisher

Elsevier BV

Subject

Spectroscopy

Reference31 articles.

1. Electron‐impact excitation of autoionizing states in xenon

2. Spectroscopic Diagnostics of Tokamak Plasmas

3. Electron Impact Ionization Cross-Section Data for Atoms, Atomic Ions, and Diatomic Molecules: I. Experimental Data

4. Comment on the interpretation of repellar curves obtained with Nier type electron impact ion sources

5. Dissociative ionisation of H2 and D2 by monoenergetic electron impact in the threshold region

Cited by 18 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Data on Cross Sections—I. Rare Gases;Electrical and Computer Engineering;2005-11-10

2. Data on Cross Sections—I. Rare Gases;Electrical and Computer Engineering;2005-11-10

3. Electron-atom collision cross sections in argon: an analysis and comments;IEEE Transactions on Dielectrics and Electrical Insulation;2004-08

4. One century of experiments on electron-atom and molecule scattering: A critical review of integral cross-sections;La Rivista del Nuovo Cimento;1996-03

5. Electron-impact cross sections for multiple ionization of Kr and Xe;Physical Review A;1992-11-01

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP