Comment on “the development of secondary ion mass spectrometry (SIMS): A retrospective” by R.E. Honig-Reference-Cited by-同舟云学术

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Comment on “the development of secondary ion mass spectrometry (SIMS): A retrospective” by R.E. Honig

Published:1986-05 Issue:1 Volume:70 Page:115
ISSN:0168-1176
Container-title:International Journal of Mass Spectrometry and Ion Processes
language:en
Short-container-title:International Journal of Mass Spectrometry and Ion Processes

Author:

Gries W.H.

Publisher

Elsevier BV

Subject

Spectroscopy

Reference7 articles.

1. The development of secondary ion mass spectrometry (SIMS): A retrospective

2. W.H. Gries and W.L. Rautenbach, 6th Int. Symp. Microtechniques, Graz, Austria, 1970, Preprints Vol. E, Verlag der Wiener Medizinischen Akademie, Vienna

3. New solid standards for the determination of trace impurities in metals by flameless atomic absorption spectrometry

4. Determination of the half-life 137Cs by a new method

5. Ion-implaned reference standards for the analysis of surface impurities by X-ray fluorescence spectrometry

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