Coincidence studies of doubly charged ions formed by 30.4 nm photoionization-Reference-Cited by-同舟云学术

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Coincidence studies of doubly charged ions formed by 30.4 nm photoionization

Published:1985-02 Issue:2-3 Volume:63 Page:241-264
ISSN:0168-1176
Container-title:International Journal of Mass Spectrometry and Ion Processes
language:en
Short-container-title:International Journal of Mass Spectrometry and Ion Processes

Author:

Curtis D.M.,Eland J.H.D.

Publisher

Elsevier BV

Subject

Spectroscopy

Reference35 articles.

1. Investigation of ion pairs from fast decay processes of doubly-charged molecular ions

2. Mass spectrometry and ionization energies of some condensed-ring aromatic and heterocyclic compounds

3. Mass spectra and doubly charged ions in photoionization at 30.4 nm and 58.4 nm

4. Decomposition of metastable diatomic doubly charged positive ions

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