A tandem time-of-flight mass spectrometer for surface-induced dissociation-Reference-Cited by-同舟云学术

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A tandem time-of-flight mass spectrometer for surface-induced dissociation

Published:1987-07 Issue:1 Volume:77 Page:49-61
ISSN:0168-1176
Container-title:International Journal of Mass Spectrometry and Ion Processes
language:en
Short-container-title:International Journal of Mass Spectrometry and Ion Processes

Author:

Schey K.,Cooks R.G.,Grix R.,Wöllnik H.

Publisher

Elsevier BV

Subject

Spectroscopy

Reference31 articles.

1. Surface investigation of solids by the statical method of secondary ion mass spectroscopy (SIMS)

2. Molecular secondary ion mass spectrometry

3. A time-of-flight mass spectrometer for measurement of secondary ion mass spectra

Cited by 77 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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3. A high sensitivity, high resolution tandem mass spectrometer to research low-energy, reactive ion–surface interactions;Review of Scientific Instruments;2020-06-01

4. Design and Performance of a Second-Generation Surface-Induced Dissociation Cell for Fourier Transform Ion Cyclotron Resonance Mass Spectrometry of Native Protein Complexes;Analytical Chemistry;2019-10-04

5. Mirror Switching for High-Resolution Ion Isolation in an Electrostatic Linear Ion Trap;Analytical Chemistry;2019-06-17

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