An FAB-MS study of the krypton bombardment-induced secondary ion emission from some tin and lead oxide samples
Author:
Publisher
Elsevier BV
Subject
Spectroscopy
Reference40 articles.
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1. The structure of gas phase tin oxide ions generated by laser ablation: A combined Fourier transform mass spectrometry and density functional theory study;Journal of Cluster Science;2002
2. SIMS and FAB-MS surface studies of Pt-Sn/Al2O3 and Pt3Pb model catalysts;Applied Surface Science;1990-08
3. Fast atom bombardment mass spectrometry (FAB MS) of organometallic, coordination, and related compounds;Mass Spectrometry Reviews;1990-05
4. A SIMS and XPS examination of low-pressure oxygen adsorption on Pt3Sn;Surface Science;1989-08
5. Characterization of a fast atom source for secondary ion mass spectrometry;Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films;1989-05
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