Measuring the Very Small Cutting-Edge Radius for a Diamond Tool Using a New Kind of SEM Having Two Detectors-Reference-Cited by-同舟云学术

Measuring the Very Small Cutting-Edge Radius for a Diamond Tool Using a New Kind of SEM Having Two Detectors

Published:1990 Issue:1 Volume:39 Page:85-88
ISSN:0007-8506
Container-title:CIRP Annals
language:en
Short-container-title:CIRP Annals

Author:

Asai S.,Taguchi Y.,Horio K.,Kasai T.,Kobayashi A.

Publisher

Elsevier BV

Subject

Industrial and Manufacturing Engineering,Mechanical Engineering

Reference11 articles.

1. Observations of Chip Producing Behavior in Ultra-Precision Diamond Machining and Study on Mirror-Like Surface Generating Mechanism;Asai;J. of JSPE,1989

2. Microfracture of Diamond as Fine Tool Material;Ikawa;Annals of the CIRP,1982

3. Ikawa N. and Shimada S., 1977, Cutting Tool for Ultra-Precision Machining, 3rd Int. Conf. Engg., Kyoto, July 14–16.

4. Measurement of Surface Topography Using SEM with Two Secondary Electron Detectors;Suganuma;J. Electron Microsc.,1985

5. Free Dendritic Growth;Glicksman;Materials Science and Engineering,1984

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