X-Ray Microanalysis of Elements in the Range Z = 4–92, Combined with Electron Microscopy and Electron Diffraction-Reference-Cited by-同舟云学术

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X-Ray Microanalysis of Elements in the Range Z = 4–92, Combined with Electron Microscopy and Electron Diffraction

Published:1963 Issue: Volume: Page:431-439
ISSN:
Container-title:X-ray Optics and X-ray Microanalysis
language:
Short-container-title:

Author:

DUNCUMB P.

Publisher

Elsevier

Reference8 articles.

1. X-Ray Yields from Elements in the Range Beryllium to Aluminium

2. Dolby, R. M. (1962). Ph.D. Thesis. University of Cambridge, Cambridge, England.

3. “X-ray Microscopy and Microradiography”;Dolby,1960

4. “X-ray Microscopy and Microradiography”;Duncumb,1960

5. Duncumb, P. (1960b). 4th Intern. Kongr. Elektronenmikroskopie, Berlin 1958, Verhand., p. 267.

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