Scanning Probe and Particle Beam Microscopy-Reference-Cited by-同舟云学术

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Scanning Probe and Particle Beam Microscopy

Published:2014 Issue: Volume: Page:205-239
ISSN:
Container-title:Fundamental Principles of Engineering Nanometrology
language:
Short-container-title:

Author:

Cuenat Alexandre,Leach Richard

Publisher

Elsevier

Reference72 articles.

1. Surface studies by scanning tunneling microscopy;Binnig;Phys. Rev. Lett.,1982

2. Scanning Probe Microscopy: The Lab on a Tip;Meyer,2003

3. Scanning Probe Microscopy and Spectroscopy: Methods and Applications;Weisendanger,1994

4. Near-Field Microscopy and Near-Field Optics;Courion,2003

5. Scanning tunneling microscopy – from birth to adolescence;Binnig;Rev. Mod. Phys.,1987

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Nanoceramics: Synthesis, Characterizations and Applications;Nanomaterials and Their Biomedical Applications;2021

2. Characterization techniques for morphological and physicochemical evaluation of nanomaterials;Nanobiotechnology;2021

3. Quantifying abrasive-blasted surface roughness profiles using scanning electron microscopy;Journal of Coatings Technology and Research;2020-04-20

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