Author:
Martin Knotter D.,Wali Faisal
Reference55 articles.
1. The International Technology Roadmap for Semiconductors, 2008 edition, International Sematech, San Jose, CA; http://www.itrs.net/, 2009.
2. Modeling manufacturing yield and reliability;Kim;IEEE Trans. Semicond. Manuf,1999
3. Design considerations for integrated electronic devices;Wallmark;Proc. IRE,1960
4. The insulated-gate field-effect transistor;Hofstein;Proc. IEEE,1963
5. Cost-size optima of monolithic integrated circuits;Murphy;Proc. IEEE,1964
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