TEM analysis of planar defects induced by Ti doping in Bi-2212 single crystals-Reference-Cited by-同舟云学术

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TEM analysis of planar defects induced by Ti doping in Bi-2212 single crystals

Published:1997-11 Issue:3-4 Volume:290 Page:239-251
ISSN:0921-4534
Container-title:Physica C: Superconductivity
language:en
Short-container-title:Physica C: Superconductivity

Author:

Træholt C.,Zandbergen H.W.,Li T.W.,Drost R.J.,Kes P.H.,Menovsky A.A.,Hien N.T.,Franse J.J.M.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Energy Engineering and Power Technology,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference16 articles.

1. Phenomenology and Applications of High Temperature Superconductors;Kes,1992

2. Vortex response to AC-fields in Bi2Sr2CaCu2O8+ delta

3. Dislocation-mediated flux creep inBi2Sr2CaCu2O8+δ

4. Oxygen stoichiometry, critical temperature and pinning mechanisms in the 2212 BSCCO superconductor

5. Flux pinning in Bi-2212 single crystals with various oxygen contents

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Vortex dynamics in Bi2Sr2CaCu2O8+δ single crystals with planar defects;Solid State Communications;2001-09

2. Effects of TiO2 addition on the superconducting properties of Bi-Sr-Ca-Cu-O system;Journal of Materials Science;2000

3. Tuning the pinning energy in layered superconductors;Physical Review B;1999-06-01

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