Phonon scattering related to oxygen precipitation in Cz-silicon
Author:
Publisher
Elsevier BV
Subject
Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference7 articles.
1. F. Shimura (Ed.), Oxygen in Silicon, Semiconductors and Semimetals, vol. 42, Academic Press, New York, 1995.
2. Oxygen precipitation in silicon
3. Investigation of Precipitation in Czochralski Silicon by Phonon Spectroscopy
4. Phonon Scattering in Heat-Treated Cz-Silicon
5. Infrared Spectroscopical and TEM Investigations of Oxygen Precipitation in Silicon Crystals with Medium and High Oxygen Concentrations
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1. Reassessment of the intrinsic carrier density in crystalline silicon in view of band-gap narrowing;Journal of Applied Physics;2003-02
2. Phonon scattering of oxygen-related defects in annealed silicon crystals;Physica B: Condensed Matter;2002-05
3. History and progress in the accurate determination of the Avogadro constant;Reports on Progress in Physics;2001-11-16
4. Phonon scattering and internal friction in dielectric and metallic films at low temperatures;Physical Review B;2001-03-13
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