Characterization of tungsten oxide films of different crystallinity prepared by RF sputtering-Reference-Cited by-同舟云学术

Characterization of tungsten oxide films of different crystallinity prepared by RF sputtering

Published:2003-01 Issue: Volume:325 Page:65-75
ISSN:0921-4526
Container-title:Physica B: Condensed Matter
language:en
Short-container-title:Physica B: Condensed Matter

Author:

Akl A.A,Kamal H,Abdel-Hady K

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference31 articles.

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5. Electrochromic materials and devices for energy efficient windows

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