Author:
Osofsky M.S.,Soulen R.J.,Claassen J.H.,Nadgorny B.,Horwitz J.S.,Trotter G.,Kim H.
Subject
Electrical and Electronic Engineering,Energy Engineering and Power Technology,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
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2. A contactless method for measurement of the critical current density and critical temperature of superconducting films
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4. Strong and weak electron spin-orbit scattering near the metal-insulator transition
5. dc conductivity of strong and weak electron spin-orbit scattering materials near the metal-insulator transition
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