Inversion in X-ray diffraction: zeros of the complex diffraction amplitude:
Author:
Publisher
Elsevier BV
Subject
Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
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1. In-situ x-ray diffraction profiling of cracks and metal-metal interfaces at the nanoscale;Developments in X-Ray Tomography VI;2008-08-28
2. X-ray diffraction profiling of metal-metal interfaces at the nanoscale;Physical Review B;2007-02-15
3. High spatial resolution mapping of partially strain-compensated SiGe:C films in the presence of postannealed defects;Journal of Applied Physics;2006-06
4. Phase-retrieval x-ray diffractometry in the case of high- or low-flux radiation source;Advances in Laboratory-based X-Ray Sources and Optics;2000-11-02
5. Phase-Retrieval X-Ray Diffractometry in the Case of High- or Low-Flux Radiation Source;physica status solidi (a);1999-04
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