A new technique for monitoring the microscopic electronic surface structures of sputtered thin films
Author:
Publisher
Elsevier BV
Subject
Surfaces, Coatings and Films,Condensed Matter Physics,Instrumentation
Reference8 articles.
1. Gautherin, G., Bouchier, D. and Schwebel, C., in Thin Films from Free Atoms and Particles, ed. K. J. Klabunde. Academic Press, New York, 1985, p. 203
2. Absolute band-structure determination by target current spectroscopy: Application to Cu(100)
3. Surface Electronic States of Adsorbed Nitrogen Molecules on Oxidized Nickel Surface
4. Obara, K., Yiji, P., Chiba, K., Fukarek, W. and Möller, W., Proc. of 3rd. Int. Conf. on Reactive Plasma and 14th Symp. on Plasma Processing, Nara 1997, p. 73
5. Target-current spectroscopy of reconstructing 5d-transition-metal surfaces as a tool for testing bulk-band-structure calculations
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