Author:
Bance UR,Drummond IW,Finbow D,Harden EH,Kenway P
Subject
Surfaces, Coatings and Films,Condensed Matter Physics,Instrumentation
Reference42 articles.
1. Electron Microscopy present and future;Mulvey,1977
2. Report of a workshop ‘On Analytical Electron Microscopy’;Isaacson,1976
3. Reduction of Specimen Contamination in Electron Beam instruments;Lehmpfuhl,1976
4. The origin of specimen contamination in the electron microscope
Cited by
15 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献