Ion sputtering of microparticles in SIMS depth profile analysis-Reference-Cited by-同舟云学术

Ion sputtering of microparticles in SIMS depth profile analysis

Published:2001-08 Issue:4 Volume:63 Page:685-689
ISSN:0042-207X
Container-title:Vacuum
language:en
Short-container-title:Vacuum

Author:

Konarski Piotr,Iwanejko Iwonna,Mierzejewska Agnieszka,Wymysłowski Artur

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Instrumentation

Reference16 articles.

1. Sputtering by Ion Bombardment

2. On the problem of the stability of pyramidal structures on bombarded copper surfaces

3. The theory of surface erosion by ion bombardment

4. Smith R, Walls JM. In: Walls JM, editor. Methods of surface analysis. Techniques and applications. Cambridge: Cambridge University Press, 1989, p. 20.

5. Quantitative analysis by submicron secondary ion mass spectrometry

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