Core level photoionization mass spectroscopy of the fluoromethylsilanes, Si(CH3)xF4-x (x = 0–4), around the Si 2p ionization edges
Author:
Publisher
Elsevier BV
Subject
Physical and Theoretical Chemistry,General Physics and Astronomy
Reference74 articles.
1. Measurement of the Relative Abundances and Recoil‐Energy Spectra of Fragment Ions Produced as the Initial Consequences of X‐Ray Interaction with CH3I, HI, and DI
2. Measurement of the Relative Abundances and Recoil Energy Spectra of Fragment Ions Produced as the Initial Consequences of X‐Ray Interaction with C2H5I, CH3CD2I, and Pb(CH3)4
3. Relative Abundances and Recoil Energies of Fragment Ions Formed from the X‐Ray Photoionization of N2, O2, CO, NO, CO2, and CF4
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