ENERGY DISTRIBUTION OF ELECTRON TRAPPING DEFECTS IN THICK-OXIDE MNOS STRUCTURES
Author:
Publisher
Elsevier
Reference6 articles.
1. Valence alternation pair model of charge storage in MNOS memory devices
2. Photoemission of Electrons from Silicon into Silicon Dioxide
3. Electron trapping levels in silicon dioxide thermally grown on silicon
4. Electron and hole transport in CVD Si3N4films
5. Energy and spatial distribution of an electron trapping center in the MOS insulator
Cited by 6 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Traps spectroscopy of the Si3Ni4 layer using localized charge-trapping nonvolatile memory device;Applied Physics Letters;2004-07-26
2. Degradation Study of Ultra-thin JVD Silicon Nitride Mnsfets;MRS Proceedings;2002
3. Interface and Bulk Traps in Oxide-Nitride Stacked Films;MRS Proceedings;1992
4. Thermal Nitridation of SiO2 Thin Films in NH3 + H2O (or O2) Mixtures;physica status solidi (a);1990-08-16
5. Influence of Top Oxide Thickness on Electrical Properties of ONO Stacked Insulators;ESSDERC ’89;1989
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3