Scanning electron microscopy (SEM) and transmission electron microscopy (TEM) for materials characterization-Reference-Cited by-同舟云学术

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Scanning electron microscopy (SEM) and transmission electron microscopy (TEM) for materials characterization

Published:2016 Issue: Volume: Page:17-43
ISSN:
Container-title:Materials Characterization Using Nondestructive Evaluation (NDE) Methods
language:
Short-container-title:

Author:

Inkson B.J.

Publisher

Elsevier

Reference31 articles.

1. Sample Preparation Handbook for Transmission Electron Microscopy;Ayache,2010

2. Advanced Tomographic Methods in Materials Research and Engineering,2008

3. In-situ Electron Microscopy at High Resolution,2008

4. Introduction to Light Microscopy;Bradbury,1998

5. Electron Energy Loss Spectroscopy;Brydson,2001

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