Factor analysis of semiconductor γ-ray spectra-Reference-Cited by-同舟云学术

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Factor analysis of semiconductor γ-ray spectra

Published:1996-09 Issue:9-10 Volume:47 Page:905-910
ISSN:0969-8043
Container-title:Applied Radiation and Isotopes
language:en
Short-container-title:Applied Radiation and Isotopes

Author:

Krnáč Š.,Povinec P.P.

Publisher

Elsevier BV

Subject

Radiation

Reference6 articles.

1. Measurements of the half-life of the 2νββ-decay of 76 Ge;Avignone;J. Phys. G: Part. Phys.,1991

2. Gamma- and X-ray Spectrometry with Semiconductor Detectors;Debertin,1988

3. Scintillation Spectroscopy of Gamma-Radiation;Shafroth,1967

4. Factor analysis and its Generalization;Blahus,1985

5. Experimental comparison of least-squares and maximum likelihood methods in factor analysis

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1. Shift endpoint trace selection algorithm and wavelet analysis to detect the endpoint using optical emission spectroscopy;Photonic Sensors;2016-04-09

2. Experimental study and simulation of the residual activity induced by high-energy argon ions in copper;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2010-03

3. Chemometrics and its applications to x-ray spectrometry;X-Ray Spectrometry;2006

4. Analysis by nuclear reactions and activation a current bibliography;Journal of Radioanalytical and Nuclear Chemistry;1999-11

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