Spectroscopic ellipsometry of Zn1−xCuxO thin films based on a modified sol–gel dip-coating technique-Reference-Cited by-同舟云学术

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Spectroscopic ellipsometry of Zn1−xCuxO thin films based on a modified sol–gel dip-coating technique

Published:2014-01 Issue: Volume:118 Page:800-805
ISSN:1386-1425
Container-title:Spectrochimica Acta Part A: Molecular and Biomolecular Spectroscopy
language:en
Short-container-title:Spectrochimica Acta Part A: Molecular and Biomolecular Spectroscopy

Author:

Al-Khanbashi Hibah A.,Shirbeeny W.,Al-Ghamdi A.A.,Bronstein Lyudmila M.,Mahmoud Waleed E.

Publisher

Elsevier BV

Subject

Spectroscopy,Instrumentation,Atomic and Molecular Physics, and Optics,Analytical Chemistry

Reference36 articles.

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3. Transparent conducting oxides based on the spinel structure;Kawazoe;J. Am. Ceram. Soc.,1999

4. Preparation and physical properties of transparent conducting oxide films;Jarzebski;Phys. Stat. Sol.,1982

5. Combinatorial synthesis of Li-doped NiO thin films and their transparent conducting properties;Joshi;Appl. Surf. Sci.,2006

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