Study the effect of temperature variation and intrinsic layer thickness on the linear response of a PIN photodetector: A finite element method approach-Reference-Cited by-同舟云学术

Study the effect of temperature variation and intrinsic layer thickness on the linear response of a PIN photodetector: A finite element method approach

Published:2023-03 Issue: Volume:17 Page:100810
ISSN:2590-1230
Container-title:Results in Engineering
language:en
Short-container-title:Results in Engineering

Author:

Deilami Saeed,Abbasi Kavoos,Houshyar Abdolreza,Izadneshan Heydar,Mortazavy Beni Hamidreza^ORCID

Publisher

Elsevier BV

Subject

General Engineering

Reference23 articles.

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4. Geiger -mode avalanche photodiodes, history, properties, and problems;Renker;Nucl. Instrum. Methods Phys. Res.,2006

5. Advances in semiconductor photodetectors for scintillators;Farrell;Nucl. Instrum. Methods Phys. Res.,1997

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