An atomistic interpretation of interface stress
Author:
Publisher
Elsevier BV
Subject
Condensed Matter Physics,General Materials Science,Mechanics of Materials,Metals and Alloys,Mechanical Engineering
Reference11 articles.
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3. Measurements of stress during vapor deposition of copper and silver thin films and multilayers
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5. J. W. Gibbs, The Scientific Papers of J. Willard Gibbs, vol. I, p. 315, Thermodynamics, Dover Publications, Inc., New York (1961)
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