Coupling model of electromigration and experimental verification – Part I: Effect of atomic concentration gradient

Author:

Cui Zhen,Fan Xuejun,Zhang YaqianORCID,Vollebregt StenORCID,Fan Jiajie,Zhang Guoqi

Funder

Lamar University

Technische Universiteit Delft

Publisher

Elsevier BV

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics

Reference85 articles.

1. Mass transport of aluminum by momentum exchange with conducting electrons;Black,1967

2. Electromigration—A brief survey and some recent results;Black;IEEE Trans. Electron Devices,1969

3. Diffusional back flows during electromigration;Blech;Acta Mater.,1998

4. Stress generation by electromigration;Blech;Appl. Phys. Lett.,1976

5. Electromigration in thin aluminum films on titanium nitride;Blech;J. Appl. Phys.,1976

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