A novel measurement method for extraction of the base resistance in the BJT
Author:
Publisher
Elsevier BV
Subject
General Engineering
Reference15 articles.
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3. Comparison of methods used for determining base spreading resistance;Unwin;Proc. IEE (London),1980
4. Base resistance measurement on bipolar junction transistors via low temperature bridge techniques;Wade;Solid-State Electronics,1976
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Cited by 1 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Experimental DC Extraction of the Base Resistance of Bipolar Transistors: Application to SiGe:C HBTs;IEEE Transactions on Electron Devices;2016-07
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