The study on a screening threshold for reliability estimation of optoelectronic coupled devices
Author:
Publisher
Elsevier BV
Subject
General Engineering
Reference10 articles.
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3. Noise as a diagnostic and prediction tool in reliability physics;Jevtic;Microelectron. Reliab.,1995
4. study of optical noise measurement as a reliability estimation for laser diodes;Dai;Microelectron. Reliab.,1995
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