Applications of the 45° reflectometry in the study of optical properties of confined semiconductor systems
Author:
Publisher
Elsevier BV
Subject
General Engineering
Reference27 articles.
1. Optical characterization of semiconductors: infrared, Raman, and photo-luminescence spectroscopy;Perkowitz,1993
2. An optical spectroscopy for detecting quantized polarization waves of excitons
3. Infrared 45° reflectometry of very thin films
4. Optical Constants of Silver, Gold, Copper, and Aluminum II The Index of Refraction n
5. Comparison of Reflection Methods for Measuring Optical Constants without Polarimetric Analysis, and Proposal for New Methods based on the Brewster Angle
Cited by 2 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Optical manifestation of quantized longitudinal polarization waves of excitons in thin films;Journal of Applied Physics;2003-03-15
2. 45° REFLECTOMETRY OF SEMICONDUCTOR QUANTUM WELLS;Modern Physics Letters B;2001-08-20
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