Author:
Li Zheng,Dezillie B,Eremin V,Li C.J,Verbitskaya E
Subject
Instrumentation,Nuclear and High Energy Physics
Cited by
7 articles.
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1. Charge carrier recombination and generation analysis in materials and devices by electron and optical beam microscopy;Microelectronics Reliability;2010-09
2. The charge collection in single side silicon microstrip detectors;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2003-03
3. Double-junction effect in proton-irradiated silicon diodes;Journal of Applied Physics;2002-08-15
4. Electric field distribution in irradiated silicon detectors;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2002-01
5. Radiation-Induced Electronic Defect Levels in High-Resistivity Si Detectors;Solid State Phenomena;2001-11