Author:
Selim F.A,Wells D.P,Harmon J.F,Kwofie J,Spaulding R,Erickson G,Roney T
Subject
Instrumentation,Nuclear and High Energy Physics
Reference15 articles.
1. X-ray Fluorescence Spectrometry;Jenkins,1999
2. Structural and Residual stress Analysis by Nondestructive Methods;Hauk,1997
3. The application of white radiation to residual stress analysis in the intermediate zone between surface and volume
4. P. Hautojarvi, A. Vehanen, in: P. Hautojarvi (Ed.), Positrons in Solids, 1979, Springer Verlag, Berlin, Heidelberg, New York, p. 1.
5. Characterization of defects in Si and SiO2−Si using positrons
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