Charge collection efficiency and resolution of an irradiated double-sided silicon microstrip detector operated at cryogenic temperatures-Reference-Cited by-同舟云学术

Charge collection efficiency and resolution of an irradiated double-sided silicon microstrip detector operated at cryogenic temperatures

Published:2000-01 Issue:1 Volume:440 Page:17-37
ISSN:0168-9002
Container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Author:

Borer K.,Janos S.,Palmieri V.G.,Buytaert J.,Chabaud V.,Chochula P.,Collins P.,Dijkstra H.,Niinikoski T.O.,Lourenço C.,Parkes C.,Saladino S.,Ruf T.,Granata V.,Pagano S.,Vitobello F.,Bell W.,Bartalini P.,Dormond O.,Frei R.,Casagrande L.,Bowcock T.,Barnett I.B.M.,Da Via C.,Konorov I.,Paul S.,Schmitt L.,Ruggiero G.,Stavitski I.,Esposito A.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference15 articles.

1. Evidence for charge collection efficiency recovery in heavily irradiated silicon detectors operated at cryogenic temperatures

2. Charge collection efficiency of irradiated silicon detector operated at cryogenic temperatures

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5. The DELPHI silicon strip microvertex detector with double sided readout

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