The noise reduction of silicon detectors by wafer analyses and technological procedures

Author:

Tykva Richard,Kopeštanský Josef

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Cited by 5 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Optimization of the Fabrication Process of InSb Schottky Diodes;Journal of the Korean Physical Society;2008-10-15

2. Correlation between the surface roughness and the leakage current of an SSB radiation detector;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2007-08

3. Analysis of the surface technology of silicon detectors for imaging of low-energy beta tracers in biological material;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2000-07

4. A Study of the Metabolic Degradation of an insect juvenile hormone analog using different radiolabeling;Helvetica Chimica Acta;1998-01-12

5. Degradation of a radiolabeled juvenile hormone analog using two insect species;Invertebrate Neuroscience;1997-09

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