Radiation hardness and lifetime studies of photodiodes for the optical readout of the ATLAS semiconductor tracker-Reference-Cited by-同舟云学术

Radiation hardness and lifetime studies of photodiodes for the optical readout of the ATLAS semiconductor tracker

Published:2001-01 Issue:3 Volume:456 Page:300-309
ISSN:0168-9002
Container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Author:

Charlton D.G.,Dowell J.D.,Homer R.J.,Jovanovic P.,Kenyon I.R.,Mahout G.,Shaylor H.R.,Sibley A.,Wilson J.A.,Bibby J.H.,Gregor I.-M.,Wastie R.L.,Weidberg A.R.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference14 articles.

1. System tests of radiation hard optical links for the ATLAS semiconductor tracker

2. ATLAS Inner Detector Technical Design Reports, CERN/LHCC/97-16/17, April 1997.

3. G. Battistoni, A. Ferrari, P.R. Sala, Background calculations for the ATLAS detector and hall, ATLAS Internal Note, ATL-GEN-94-010, October 1994.

4. Irradiation tests of photodiodes for the ATLAS SCT readout

5. Neutron Damage Equivalence for Silicon, Silicon Dioxide, and Gallium Arsenide

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