Author:
Vizkelethy G.,Brunett B.A.,Walsh D.S.,James R.B.,Doyle B.L.
Subject
Instrumentation,Nuclear and High Energy Physics
Cited by
8 articles.
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1. The establishment and performance of IBIC microscopy at Fudan University;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2019-07
2. Semiconductor Characterization by Scanning Ion Beam Induced Charge (IBIC) Microscopy;ISRN Materials Science;2013-01-17
3. Radiation Effects Microscopy;Characterization of Materials;2012-10-12
4. A review of ion beam induced charge microscopy;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2007-11
5. A comparison between GaAs and CdTe for X-ray imaging;IEEE Transactions on Nuclear Science;2004-10