A pulsed nanosecond IR laser diode system to automatically test the Single Event Effects in the laboratory-Reference-Cited by-同舟云学术

A pulsed nanosecond IR laser diode system to automatically test the Single Event Effects in the laboratory

Published:2002-06 Issue:1-2 Volume:485 Page:183-187
ISSN:0168-9002
Container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Author:

Alpat B.,Battiston R.,Bizzarri M.,Blasko S.,Caraffini D.,Dimasso L.,Esposito G.,Farnesini L.,Ionica M.,Menichelli M.,Papi A.,Pontetti G.,Postolache V.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference10 articles.

1. ESA/SSC Basic Specification 25100, Single Event Effects Test Method and Guidelines, Edited by ESA.

2. Laboratory tests for single-event effects

3. Use of COTS microelectronics in radiation environments

4. Online documentation, IDE AS, Integrated Detector & Electronic, Oslo NO, URL: http://193.216.193.195/downloadASICdocuments/, files Va64_hdr9.pdf e Va64_hdr4.pdf.

5. Critical evaluation of the pulsed laser method for single event effects testing and fundamental studies

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