Investigation of strong electric-field induced surface phenomena by soft X–UV laser interferometry-Reference-Cited by-同舟云学术

Investigation of strong electric-field induced surface phenomena by soft X–UV laser interferometry

Published:1998-10 Issue:1 Volume:416 Page:189-191
ISSN:0168-9002
Container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Author:

Zeitoun Ph.,Albert F.,Jaeglé P.,Joyeux D.,Boussoukaya M.,Carillon A.,Hubert S.,Jamelot G.,Klisnick A.,Phalippou D.,Lagron J.C,Ros D.,Sebban S.,Zeitoun-Fakiris A.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference7 articles.

1. P. Jaeglé, S. Sebban, A. Carillon, G. Jamelot, A. Klisnick, Ph. Zeitoun, B. Rus, F. Albert, D. Ros, in ref. 1, pp. 1–8.

2. Efficient, high-brightness soft-x-ray laser at 21.2 nm

3. X-Ray Microscopy and Spectroscopy;Joyeux,1998

4. Interferograms obtained with a X-ray laser by means of a wavefront division interferometer

5. M. Boussoukaya, A. Curtoni, A. Zeitoun-Fakiris, Nucl. Instr. and Meth. A 373 (1996) 168; SPIE 2259 (1994) 6.

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