Author:
Shipsey I.,Alexander J.,Arndt K.,Bean A.,Bebek C.,Boyd R.,Brandenburg G.,Cherwinka J.,Darling C.,Duboscq J.,Fast J.,Foland A.,Hopman P.,Gan K.K.,Gao Y.,Kagan H.,Kass R.,Kim P.,Miller D.,Miller W.,Menon N.,Nemati B.,Oliver J.,Rush C.,Skubic P.,Spencer M.B.,Ward C.,Yurko M.,Zoeller M.
Subject
Instrumentation,Nuclear and High Energy Physics
Reference8 articles.
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5. Radiation-induced surface leakage currents in silicon microstrip detectors
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