The pixe analytical technique: Principle and applications
Author:
Publisher
Elsevier BV
Subject
Radiation
Reference9 articles.
1. Ion Beams for Materials Analysis;Cohen,1989
2. Focusing protons and light ions to micron and submicron dimensions
3. PIXE: a Novel Technique for Elemental Analysis;Johanson,1988
4. Microprobe techniques and instrumentation
5. The Guelph PIXE software package
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