Combination of EBSP measurements and SIMS to study crystallographic orientation dependence of diffusivities in a polycrystalline material: oxygen tracer diffusion in La2 − xSrxCuO4 ± δ-Reference-Cited by-同舟云学术

Combination of EBSP measurements and SIMS to study crystallographic orientation dependence of diffusivities in a polycrystalline material: oxygen tracer diffusion in La2 − xSrxCuO4 ± δ

Published:1996-04 Issue:3 Volume:38 Page:251-257
ISSN:0921-5107
Container-title:Materials Science and Engineering: B
language:en
Short-container-title:Materials Science and Engineering: B

Author:

Claus Jürgen,Borchardt Günter,Weber Sylvain,Hiver Jean-Marie,Scherrer Stanislas

Publisher

Elsevier BV

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

Reference29 articles.

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4. Electron back-scattering patterns — A new technique for obtaining crystallographic information in the scanning electron microscope;Venables;Philos. Mag.,1973

5. A comparison of diffraction techniques for the SEM;Dingley;Scanning Electron Microsc.,1981

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