Proximal probes: Techniques for measuring at the nanometer scale-Reference-Cited by-同舟云学术

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Proximal probes: Techniques for measuring at the nanometer scale

Published:1990-06 Issue:2-3 Volume:6 Page:77-85
ISSN:0921-5107
Container-title:Materials Science and Engineering: B
language:en
Short-container-title:Materials Science and Engineering: B

Author:

Murday James S.,Colton Richard J.

Publisher

Elsevier BV

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

Reference62 articles.

1. Fundamentals of Surface and Thin Film Analysis;Feldman,1986

2. Methods of Surface Analysis,1975

3. Practical Surface Analysis by Auger and X-ray Photoelectron Spectroscopy,1983

4. Secondary Ion Mass Spectrometry: Basic Concepts, Instrumental Aspects, Applications and Trends;Benninghoven,1987

5. Surface analysis: X-ray photoelectron spectroscopy and Auger electron spectroscopy;Turner;Anal. Chem.,1988

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1. New ideas in biomaterials science—a path to engineered biomaterials;Journal of Biomedical Materials Research;1993-07

2. Materials by numbers;Physica D: Nonlinear Phenomena;1993-06

3. Interpretation of force curves in force microscopy;Nanotechnology;1993-04-01

4. Simulations of Materials: Clusters and Interfacial Junctions;Computations for the Nano-Scale;1993

5. Simulations of materials: from electrons to friction;Philosophical Transactions of the Royal Society of London. Series A: Physical and Engineering Sciences;1992-11-16

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