Measurement of shallow dopant impurity profile in silicon using anodic sectioning and Lange method of Hall measurement-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Measurement of shallow dopant impurity profile in silicon using anodic sectioning and Lange method of Hall measurement

Published:1996-08 Issue:1 Volume:43 Page:15-20
ISSN:0927-0248
Container-title:Solar Energy Materials and Solar Cells
language:en
Short-container-title:Solar Energy Materials and Solar Cells

Author:

Basu P.K.,Chakravarty B.C.,Singh S.N.,Dutta P.,Kesavan R.

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Renewable Energy, Sustainability and the Environment,Electronic, Optical and Magnetic Materials

Reference13 articles.

1. Dopant profile analysis of boron in solar grade poly‐ and single‐ crystalline silicon

2. A computer algorithm for accurate and repeatable profile analysis using anodization and stripping of silicon

3. Method for Hall Mobility and Resistivity Measurements on Thin Layers

Cited by 10 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Solar cell technology;Energy Materials;2021

2. Crystalline silicon solar cells;Energy Materials;2021

3. A new energy efficient, environment friendly and high productive texturization process of industrial multicrystalline silicon solar cells;Renewable Energy;2009-12

4. The ohmic properties and current–voltage characteristics of the screen-printed silicon solar cells with porous silicon surface;Solid State Communications;2009-06

5. Specific contact resistance and carrier tunneling properties of the silver metal/porous silicon/p-Si ohmic contact structure;Journal of Alloys and Compounds;2009-02

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号京ICP备18003416号-3