Density, sp 3 content and internal layering of DLC films by X-ray reflectivity and electron energy loss spectroscopy-Reference-Cited by-同舟云学术

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Density, sp 3 content and internal layering of DLC films by X-ray reflectivity and electron energy loss spectroscopy

Published:2000-04 Issue:3-6 Volume:9 Page:771-776
ISSN:0925-9635
Container-title:Diamond and Related Materials
language:en
Short-container-title:Diamond and Related Materials

Author:

LiBassi A.,Ferrari A.C.,Stolojan V.,Tanner B.K.,Robertson J.,Brown L.M.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Materials Chemistry,Mechanical Engineering,General Chemistry,Electronic, Optical and Magnetic Materials

Reference23 articles.

1. Measurements of carbon thin films using x‐ray reflectivity

2. X‐ray reflectivity measurements of the expansion of carbon films upon annealing

3. Studies of density and surface roughness of ultrathin amorphous carbon films with regards to thickness with x-ray reflectometry and spectroscopic ellipsometry

4. Study of hydrogenated diamond-like carbon films using x-ray reflectivity

5. X-ray Absorption and Reflection in the Hard X-Ray Range;Lengeler,1990

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