EXAFs and XPS studies of Hg1−xZnxTe: Determination of local atomic structure and valence band maximum
Author:
Publisher
Elsevier BV
Subject
Condensed Matter Physics,General Materials Science,General Chemistry
Reference20 articles.
1. Advanced Research Workshop NATO, International Science Exchange Programme;Sher,1988
2. (Hg,Zn)Te: A new material for IR detection
3. Epitaxial growth, characterization, and phase diagram of HgZnTe
4. Properties of Hg1−xZnxTe grown by liquid‐phase epitaxy
5. Summary Abstract: Natural band lineups in II–VI compound semiconductors and their alloys: A study using core level photoemission measurement in the alloy
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