Structural and optical properties of silica single-layer films doped with ZnS quantum dots: Photoluminescence monitoring of annealing-induced defects-Reference-Cited by-同舟云学术

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Structural and optical properties of silica single-layer films doped with ZnS quantum dots: Photoluminescence monitoring of annealing-induced defects

Published:2018-03 Issue: Volume:76 Page:42-49
ISSN:1369-8001
Container-title:Materials Science in Semiconductor Processing
language:en
Short-container-title:Materials Science in Semiconductor Processing

Author:

Belache Boukhalfa,Khelfaoui Youcef,Bououdina Mohamed,Souier Tewfik,Cai Weiping

Publisher

Elsevier BV

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

Reference51 articles.

1. Optical gain and stimulated emission in nanocrystal quantum dots;Klimov;Science,2000

2. Quantum dot sensitization of organic-inorganic hybrid solar cells;Plass;J. Phys. Chem. B,2002

3. Quantum dot solar concentrators;Chatten;Semiconductors,2004

4. Quantum dot containing nanocomposite thin films for photoluminescent solar concentrators;Schüler;Sol. Energy,2007

5. Quantum dot bioconjugates for ultrasensitive non isotopic detection;Chan;Science,1998

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1. A Short Analysis on the Morphological Characterization of Colloidal Quantum Dots for Photovoltaic Applications;Current Nanoscience;2020-08-20

2. Determination of some properties of ZnSB thin films deposited by a thermionic vacuum arc technique;Journal of Materials Science: Materials in Electronics;2019-09-26

3. Photoluminescence of ZnS:Cu quantum dots embedded in silica thin films;Journal of Luminescence;2019-03

4. Versatile route to core–shell reinforced network nanostructures;Nanoscale;2019

5. Concomitant preparation of ZnS thin film and nanopowder forms from SILAR baths: An attempt to sort-out wastage problem;Journal of Materials Science: Materials in Electronics;2018-11-24

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