Theoretical studies on phase stability, electronic, optical, mechanical and thermal properties of chalcopyrite semiconductors HgXN2 (X=Si, Ge and Sn): A comprehensive DFT analysis
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Published:2024-03
Issue:
Volume:172
Page:108092
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ISSN:1369-8001
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Container-title:Materials Science in Semiconductor Processing
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language:en
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Short-container-title:Materials Science in Semiconductor Processing
Author:
Hossain A.,
Ali M.A.,
Uddin M.M.,
Naqib S.H.,
Hossain M.M.ORCID
Cited by
4 articles.
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