Nanoindentation characterization of thin film stack structures by finite element analysis and experiments using acoustic emission testing-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Nanoindentation characterization of thin film stack structures by finite element analysis and experiments using acoustic emission testing

Published:2022-08 Issue: Volume:147 Page:106737
ISSN:1369-8001
Container-title:Materials Science in Semiconductor Processing
language:en
Short-container-title:Materials Science in Semiconductor Processing

Author:

Liu Chen,Nagler Oliver,Tremmel Florian,Unterreitmeier Marianne,Frick Jessica J.,Gu X. Wendy,Senesky Debbie G.

Funder

National Science Foundation

Publisher

Elsevier BV

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

Reference42 articles.

1. Bond pad structure reliability;Ching,1988

2. Effects of probe damage on wire bond integrity;Hotchkiss,2001

3. Use of harsh wafer probing to evaluate traditional and CUP bond pad structures;Hunter;IEEE Trans. Compon. Packag. Manuf. Technol.,2013

4. Use of harsh wafer probing to evaluate various bond pad structures;Hunter;IEEE Semiconductor Wafer Test Workshop,2011

5. Use of harsh wire bonding to evaluate various bond pad structures;Hunter,2011

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Challenges and strategies to optimize the figure of merit: Keeping eyes on thermoelectric metamaterials;Materials Science in Semiconductor Processing;2022-11

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP