IGBT lifetime model considering composite failure modes-Reference-Cited by-同舟云学术

IGBT lifetime model considering composite failure modes

Published:2022-06 Issue: Volume:143 Page:106529
ISSN:1369-8001
Container-title:Materials Science in Semiconductor Processing
language:en
Short-container-title:Materials Science in Semiconductor Processing

Author:

Li Lie^ORCID,He Yigang,Wang Lei^ORCID,Wang Chuankun,Liu Xiaoyan

Publisher

Elsevier BV

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

Reference31 articles.

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3. A comprehensive review toward the state-of-the-art in failure and lifetime predictions of power electronic devices;Abu;IEEE Trans. Power Electron.,2018

4. A simple estimator of the shape factor of the two-parameter Weibull distribution;Christofferson;J. Appl. Meteorol.,2010

5. Comparative analysis of IGBT parameters variation under different accelerated aging experiments;Sathik;IEEE Trans. Electron. Dev.,2020

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